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123
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DFT
2004
IEEE
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VLSI
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DFT 2004
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Characteristics of Fault-Tolerant Photodiode and Photogate Active Pixel Sensor (APS)
15 years 6 months ago
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deneb.ensc.sfu.ca
Reliability and manufacturing costs due to defects is a significant problem with image sensors and the ability to recover from a fault would alleviate some of these costs. A fault...
Michelle L. La Haye, Glenn H. Chapman, Cory Jung, ...
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