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154
Voted
MICRO
1991
IEEE
126views Hardware» more  MICRO 1991»
15 years 4 months ago
Data Access Microarchitectures for Superscalar Processors with Compiler-Assisted Data Prefetching
The performance of superscalar processors is more sensitive to the memory system delay than their single-issue predecessors. This paper examines alternative data access microarchi...
William Y. Chen, Scott A. Mahlke, Pohua P. Chang, ...
115
Voted
MICRO
1991
IEEE
85views Hardware» more  MICRO 1991»
15 years 4 months ago
Comparing Static and Dynamic Code Scheduling for Multiple-Instruction-Issue Processors
This paper examines two alternative approaches to supporting code scheduling for multiple-instruction-issue processors. One is to provide a set of non-trapping instructions so tha...
Pohua P. Chang, William Y. Chen, Scott A. Mahlke, ...
71
Voted
MICRO
1991
IEEE
93views Hardware» more  MICRO 1991»
15 years 4 months ago
Strategies for Branch Target Buffers
Brian K. Bray, Michael J. Flynn
75
Voted
ISCA
1992
IEEE
90views Hardware» more  ISCA 1992»
15 years 4 months ago
Comparative Performance Evaluation of Cache-Coherent NUMA and COMA Architectures
Per Stenström, Truman Joe, Anoop Gupta
79
Voted
ITC
1991
IEEE
97views Hardware» more  ITC 1991»
15 years 4 months ago
An IEEE 1149.1 Based Logic/Signature Analyzer in a Chip
Lee Whetsel
85
Voted
ITC
1991
IEEE
80views Hardware» more  ITC 1991»
15 years 4 months ago
An Intelligent Approach to Automatic Test Equipment
In diagnosing a failed system, a smart technician would choose tests to be performed based on the context of the situation. Currently, test program sets do not fault-. isolate wit...
William R. Simpson, John W. Sheppard
66
Voted
ITC
1991
IEEE
92views Hardware» more  ITC 1991»
15 years 4 months ago
Refined Bounds on Signature Analysis Aliasing for Random Testing
Nirmal R. Saxena, Piero Franco, Edward J. McCluske...
76
Voted
ITC
1991
IEEE
88views Hardware» more  ITC 1991»
15 years 4 months ago
Software Testing
Paul D. Roddy
103
Voted
ITC
1991
IEEE
112views Hardware» more  ITC 1991»
15 years 4 months ago
Built-In Self-Diagnostic Read-Only-Memories
Prawat Nagvajara, Mark G. Karpovsky
94
Voted
ITC
1991
IEEE
86views Hardware» more  ITC 1991»
15 years 4 months ago
Test Pattern Generation for Realistic Bridge Faults in CMOS ICs
Two approaches have been used to balance the cost of generating e ective tests for ICs and the need to increase the ICs' quality level. The rst approach favorsusing high-leve...
F. Joel Ferguson, Tracy Larrabee