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109
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ATS
2009
IEEE
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ATS 2009
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Test Pattern Selection for Potentially Harmful Open Defects in Power Distribution Networks
15 years 10 months ago
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www.cse.cuhk.edu.hk
Power distribution network (PDN) designs for today’s high performance integrated circuits (ICs) typically occupy a significant share of metal resources in the circuit, and henc...
Yubin Zhang, Lin Huang, Feng Yuan, Qiang Xu
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