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120
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DFT
2007
IEEE
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VLSI
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DFT 2007
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A Fault-Tolerant Active Pixel Sensor to Correct In-Field Hot Pixel Defects
15 years 9 months ago
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deneb.ensc.sfu.ca
Solid-state image sensors develop in-field defects in all common environments. Experiments have demonstrated the growth of significant quantities of hot-pixel defects that degrade...
Jozsef Dudas, Michelle L. La Haye, Jenny Leung, Gl...
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