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DFT
2004
IEEE
95views VLSI» more  DFT 2004»
15 years 15 days ago
Mixed Loopback BiST for RF Digital Transceivers
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...
Jerzy Dabrowski, Javier Gonzalez Bayon