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106
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MICRO
2009
IEEE
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MICRO 2009
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Tribeca: design for PVT variations with local recovery and fine-grained adaptation
15 years 9 months ago
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www.eecs.harvard.edu
With continued advances in CMOS technology, parameter variations are emerging as a major design challenge. Irregularities during the fabrication of a microprocessor and variations...
Meeta Sharma Gupta, Jude A. Rivers, Pradip Bose, G...
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