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MVA
2007
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14 years 10 months ago
A Physics-Based Imaging Model of Scanning Electron Microscopes
This paper discusses a physics-based imaging model of scanning electron microscopes (SEM). The purpose is to accurately examine the imaging process of a SEM, which has to be neces...
Kousuke Kamada, Takayuki Okatani, Koichiro Deguchi
CVPR
2008
IEEE
14 years 10 months ago
Photometric stereo with coherent outlier handling and confidence estimation
In photometric stereo a robust method is required to deal with outliers, such as shadows and non-Lambertian reflections. In this paper we rely on a probabilistic imaging model tha...
Frank Verbiest, Luc J. Van Gool