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85
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2008
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MR 2008
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Characterization of semiconductor interfaces using a modified mixed mode bending apparatus
15 years 2 months ago
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This research deals with the experimental assessment of the strength of bi-material interfaces as a function of mode mixity, focusing on two dimensional problems. A modified mixed...
J. Thijsse, Olaf van der Sluis, J. A. W. van Domme...
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