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HIPEAC
2010
Springer
15 years 5 months ago
Maestro: Orchestrating Lifetime Reliability in Chip Multiprocessors
As CMOS feature sizes venture deep into the nanometer regime, wearout mechanisms including negative-bias temperature instability and timedependent dielectric breakdown can severely...
Shuguang Feng, Shantanu Gupta, Amin Ansari, Scott ...