Sciweavers

81
Voted
ECCV
2008
Springer
15 years 11 months ago
Passive Reflectometry
Different materials reflect light in different ways, so reflectance is a useful surface descriptor. Existing systems for measuring reflectance are cumbersome, however, and although...
Fabiano Romeiro, Yuriy Vasilyev, Todd Zickler
CVPR
2008
IEEE
15 years 11 months ago
Photometric stereo with non-parametric and spatially-varying reflectance
We present a method for simultaneously recovering shape and spatially varying reflectance of a surface from photometric stereo images. The distinguishing feature of our approach i...
Neil G. Alldrin, Todd Zickler, David J. Kriegman