ECCV
2008
Springer
16 years 9 days ago
2008
Springer
Different materials reflect light in different ways, so reflectance is a useful surface descriptor. Existing systems for measuring reflectance are cumbersome, however, and although...
CVPR
2008
IEEE
16 years 13 days ago
2008
IEEE
We present a method for simultaneously recovering shape and spatially varying reflectance of a surface from photometric stereo images. The distinguishing feature of our approach i...