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ISQED
2000
IEEE
80views Hardware» more  ISQED 2000»
13 years 9 months ago
A Statistical Model for Electromigration Failures
The lognormal has been traditionally used to model the failure time distribution of electromigration failures. However, when used to estimate the failure of large metal layers, it...
Gilbert Yoh, Farid N. Najm
ISQED
2000
IEEE
117views Hardware» more  ISQED 2000»
13 years 9 months ago
Realistic Worst-Case Modeling by Performance Level Principal Component Analysis
A new algorithm to determine the number and value of realistic worst-case models for the performance of module library components is presented in this paper. The proposed algorith...
Alessandra Nardi, Andrea Neviani, Carlo Guardiani
ISQED
2000
IEEE
91views Hardware» more  ISQED 2000»
13 years 9 months ago
Probabilistic Bottom-Up RTL Power Estimation
We address the problem of power estimation at the register-transfer level (RTL). At this level, the circuit is described in terms of a set of interconnected memory elements and co...
Ricardo Ferreira, A.-M. Trullemans, José C....
ISQED
2000
IEEE
136views Hardware» more  ISQED 2000»
13 years 9 months ago
A Layout Approach for Electrical and Physical Design Integration of High-Performance Analog Circuits
This paper presents a layout generation tool that aims to reduce the gap between electrical sizing and physical realization of high performance analog circuits. The procedural lay...
Mohamed Dessouky, Marie-Minerve Louërat
ISQED
2000
IEEE
131views Hardware» more  ISQED 2000»
13 years 9 months ago
Low Power Testing of VLSI Circuits: Problems and Solutions
Power and energy consumption of digital systems may increase significantly during testing. This extra power consumption due to test application may give rise to severe hazards to ...
Patrick Girard