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ITC
1991
IEEE
80views Hardware» more  ITC 1991»
13 years 10 months ago
An Intelligent Approach to Automatic Test Equipment
In diagnosing a failed system, a smart technician would choose tests to be performed based on the context of the situation. Currently, test program sets do not fault-. isolate wit...
William R. Simpson, John W. Sheppard
ITC
1991
IEEE
92views Hardware» more  ITC 1991»
13 years 10 months ago
Refined Bounds on Signature Analysis Aliasing for Random Testing
Nirmal R. Saxena, Piero Franco, Edward J. McCluske...
ITC
1991
IEEE
88views Hardware» more  ITC 1991»
13 years 10 months ago
Software Testing
Paul D. Roddy
ITC
1991
IEEE
112views Hardware» more  ITC 1991»
13 years 10 months ago
Built-In Self-Diagnostic Read-Only-Memories
Prawat Nagvajara, Mark G. Karpovsky
ITC
1991
IEEE
86views Hardware» more  ITC 1991»
13 years 10 months ago
Test Pattern Generation for Realistic Bridge Faults in CMOS ICs
Two approaches have been used to balance the cost of generating e ective tests for ICs and the need to increase the ICs' quality level. The rst approach favorsusing high-leve...
F. Joel Ferguson, Tracy Larrabee