ITC
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper presents a novel technique to evaluate the noncontrollability measures of state registers for partial scan design. Our model uses implicit techniques for finite state ma...
ITC
1998
IEEE
13 years 9 months ago
1998
IEEE
ITC
1998
IEEE
13 years 10 months ago
1998
IEEE
Advances in semiconductor process and design technology enable the design of complex system chips. Traditional IC design, in which every circuit is designed from scratch and reuse...
ITC
1998
IEEE
13 years 10 months ago
1998
IEEE
This paper presents a logic synthesis tool called BETSY (BIST Environment Testable Synthesis) for synthesizing circuits that achieve complete (100%)fault coverage in a user specif...
ITC
1998
IEEE
13 years 10 months ago
1998
IEEE
A method for measuring inter-symbol interference, duty cycle distortion, random jitter and periodic jitter is described. The Blackman-Tukey method of signal analysis is used. This...
ITC
1998
IEEE
13 years 10 months ago
1998
IEEE
Abstract - This paper addresses the issue of the stimulation of charge-pump phase-locked loops for built-in selftest applications. It is shown that three nodes of the PLL qualify f...
ITC
1998
IEEE
13 years 10 months ago
1998
IEEE
ITC
1998
IEEE
13 years 10 months ago
1998
IEEE
ITC
1998
IEEE
13 years 10 months ago
1998
IEEE
: We introduce the first BIST approach for testing the programmable routing network in FPGAs. Our method detects opens in, and shorts among, wiring segments, and also faults affect...
ITC
1998
IEEE
13 years 10 months ago
1998
IEEE
New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. W...