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72
Voted
DAC
2004
ACM
15 years 10 months ago
Statistical timing analysis based on a timing yield model
Starting from a model of the within-die systematic variations using principal components analysis, a model is proposed for estimation of the parametric yield, and is then applied ...
Farid N. Najm, Noel Menezes
DAC
2004
ACM
15 years 10 months ago
STAC: statistical timing analysis with correlation
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
Jiayong Le, Xin Li, Lawrence T. Pileggi
97
Voted
DAC
2003
ACM
15 years 10 months ago
Death, taxes and failing chips
In the way they cope with variability, present-day methodologies are onerous, pessimistic and risky, all at the same time! Dealing with variability is an increasingly important as...
Chandu Visweswariah