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90
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ITC
2003
IEEE
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ITC 2003
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Critical Timing Analysis in Microprocessors Using Near-IR Laser Assisted Device Alteration (LADA)
15 years 8 months ago
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www.itcprogramdev.org
A scalable laser-based timing analysis technique we call laser assisted device alteration (LADA) is introduced for the rapid isolation and analysis of defect-free performance limi...
Jeremy A. Rowlette, Travis M. Eiles
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