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ICCAD
2008
IEEE
141views Hardware» more  ICCAD 2008»
15 years 10 months ago
Layout decomposition for double patterning lithography
In double patterning lithography (DPL) layout decomposition for 45nm and below process nodes, two features must be assigned opposite colors (corresponding to different exposures)...
Andrew B. Kahng, Chul-Hong Park, Xu Xu, Hailong Ya...