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VLSID
2008
IEEE
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VLSID 2008
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Temperature and Process Variations Aware Power Gating of Functional Units
16 years 3 months ago
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www.public.asu.edu
Technology scaling has resulted in an exponential increase in the leakage power as well as the variations in leakage power of fabricated chips. Functional units (FUs), like Intege...
Deepa Kannan, Aviral Shrivastava, Vipin Mohan, Sar...
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