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117
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WSC
2007
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Modeling And Simulation
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WSC 2007
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Sensitivity analysis on causal events of WIP bubbles by a log-driven simulator
15 years 5 months ago
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www.informs-sim.org
Fluctuations of work-in-progress (WIP) levels cause variability of cycle time and often lead to productivity losses in semiconductor wafer fabrication plants. To identify sources ...
Ryo Hirade, Rudy Raymond, Hiroyuki Okano
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