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108
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ISSRE
2003
IEEE
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Software Engineering
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ISSRE 2003
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Using a Log-normal Failure Rate Distribution for Worst Case Bound Reliability Prediction
15 years 8 months ago
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Prior research has suggested that the failure rates of faults follow a log normal distribution. We propose a specific model where distributions close to a log normal arise natural...
Peter G. Bishop, Robin E. Bloomfield
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