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123
Voted
DAC
2005
ACM
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Computer Architecture
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DAC 2005
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Logic soft errors in sub-65nm technologies design and CAD challenges
15 years 4 months ago
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www.cs.york.ac.uk
Logic soft errors are radiation induced transient errors in sequential elements (flip-flops and latches) and combinational logic. Robust enterprise platforms in sub-65nm technolog...
Subhasish Mitra, Tanay Karnik, Norbert Seifert, Mi...
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