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ICCAD
2001
IEEE
100views Hardware» more  ICCAD 2001»
15 years 5 months ago
Coupled Analysis of Electromigration Reliability and Performance in ULSI Signal Nets
In deep submicron VLSI circuits, interconnect reliability due to electromigration and thermal effects is fast becoming a serious design issue particularly for long signal lines. T...
Kaustav Banerjee, Amit Mehrotra