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131
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DATE
2008
IEEE
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DATE 2008
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An novel Methodology for Reducing SoC Test Data Volume on FPGA-based Testers
15 years 9 months ago
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Low-Cost test methodologies for Systems-on-Chip are increasingly popular. They dictate which features have to be included on-chip and which test procedures have to be adopted in o...
Paolo Bernardi, Matteo Sonza Reorda
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