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    ASPDAC
    2006
    ACM
    96views Hardware» more  ASPDAC 2006»
    Low-overhead design of soft-error-tolerant scan flip-flops with enhanced-scan capability
    15 years 16 days ago
    Low-overhead design of soft-error-tolerant scan flip-flops with enhanced-scan capability
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    Ashish Goel, Swarup Bhunia, Hamid Mahmoodi-Meimand...
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