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DATE
2009
IEEE
105views Hardware» more  DATE 2009»
16 years 10 days ago
Enrichment of limited training sets in machine-learning-based analog/RF test
Abstract— This paper discusses the generation of informationrich, arbitrarily-large synthetic data sets which can be used to (a) efficiently learn tests that correlate a set of ...
Haralampos-G. D. Stratigopoulos, Salvador Mir, Yio...