Sciweavers

    75
    Voted
    VLSID
    2003
    IEEE
    114views VLSI» more  VLSID 2003»
    Substrate Bias Effect on Cycling Induced Performance Degradation of Flash EEPROMs
    16 years 26 days ago
    Substrate Bias Effect on Cycling Induced Performance Degradation of Flash EEPROMs
    Download  www.essderc2002.deis.unibo.it
    Cycling induced performance degradation of flash EEPROMs has been reported for VB=0 and VB<0 programming operation. Compared to VB=0, VB<0 programming shows lower interface ...
    S. Mahapatra, S. Shukuri, Jeff Bude
    claim paper
    Read More »
    Explore & Download
    Proceedings Preprints Top 5 Ranked Papers Publications Books Software Tutorials Presentations Lectures Notes Datasets
    Productivity Tools
    International On-screen Keyboard Graphical Social Symbols OCR Text Recognition CSS3 Style Generator Web Page to PDF Web Page to Image PDF Split PDF Merge Latex Equation Editor Sci2ools
    Document Tools
    PDF to Text PDF to Postscript PDF to Thumbnails Excel to PDF Word to PDF Postscript to PDF PowerPoint to PDF Latex to Word Repair Corrupted PDF
    Image Tools
    JPG to PS JPG to PDF Extract Images from PDF Image Converter
    Sciweavers
    About Community Cookies Privacy Policy Terms of Use

    Copyright © Sciweavers LLC, 2009-2025, USA.