Sciweavers
Explore
Publications
Books
Software
Tutorials
Presentations
Lectures Notes
Datasets
Labs
Conferences
Community
Upcoming
Conferences
Top Ranked Papers
Most Viewed Conferences
Conferences by Acronym
Conferences by Subject
Conferences by Year
Tools
PDF Tools
Image Tools
Text Tools
OCR Tools
Symbol and Emoji Tools
On-screen Keyboard
Latex Math Equation to Image
Smart IPA Phonetic Keyboard
Community
Sciweavers
About
Terms of Use
Privacy Policy
Cookies
130
click to vote
DFT
2004
IEEE
118
views
VLSI
»
more
DFT 2004
»
Defect Characterization for Scaling of QCA Devices
15 years 7 months ago
Download
www.ece.neu.edu
Quantum dot Cellular Automata (QCA) is amongst promising new computing scheme in the nano-scale regimes. As an emerging technology, QCA relies on radically different operations in...
Jing Huang, Mariam Momenzadeh, Mehdi Baradaran Tah...
claim paper
Read More »