Sciweavers

66
Voted
ASPDAC
2008
ACM
78views Hardware» more  ASPDAC 2008»
14 years 11 months ago
Handling partial correlations in yield prediction
In nanometer regime, IC designs have to consider the impact of process variations, which is often indicated by manufacturing/parametric yield. This paper investigates a yield model...
Sridhar Varadan, Janet Meiling Wang, Jiang Hu