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114
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ATS
2009
IEEE
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ATS 2009
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Customized Algorithms for High Performance Memory Test in Advanced Technology Node
15 years 9 months ago
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Embedded memory quality is critical to overall chip quality. New defect mechanisms that occur at advanced process nodes (65nm and below) are often more pronounced in memories due ...
Shomo Chen, Ning Huang, Ting-Pu Tai, Actel Niu
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