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139
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ICCAD
2009
IEEE
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ICCAD 2009
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Multi-functional interconnect co-optimization for fast and reliable 3D stacked ICs
15 years 15 days ago
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www.gtcad.gatech.edu
Heat removal and power delivery have become two major reliability concerns in 3D stacked IC technology. For thermal problem, two possible solutions exist: thermal-through-silicon-...
Young-Joon Lee, Rohan Goel, Sung Kyu Lim
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