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94
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VTS
1999
IEEE
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Hardware
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VTS 1999
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A New Bare Die Test Methodology
15 years 7 months ago
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cadlab.ece.ucsb.edu
1 While multichip module technology has been developed for high performance IC applications, the technology is not widely adopted due to economical reasons. One of the reasons that...
Zao Yang, K.-T. Cheng, K. L. Tai
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