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ITC
2003
IEEE
149views Hardware» more  ITC 2003»
15 years 10 months ago
On Reducing Aliasing Effects and Improving Diagnosis of Logic BIST Failures
Diagnosing failing vectors in a Built-In Self Test (BIST) environment is a difficult task because of the highly compressed signature coming out of the Multiple Input Shift Regist...
Ramesh C. Tekumalla