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152
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VTS
2000
IEEE
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VTS 2000
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Detection of CMOS Defects under Variable Processing Conditions
15 years 7 months ago
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www.cs.umbc.edu
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
Amy Germida, James F. Plusquellic
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