Sciweavers

DAC
2005
ACM
13 years 7 months ago
Constraint-aware robustness insertion for optimal noise-tolerance enhancement in VLSI circuits
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
Chong Zhao, Yi Zhao, Sujit Dey
DATE
2005
IEEE
128views Hardware» more  DATE 2005»
13 years 11 months ago
Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits
Nanometer circuits are becoming increasingly susceptible to soft-errors due to alpha-particle and atmospheric neutron strikes as device scaling reduces node capacitances and suppl...
Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhij...