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DAC
2011
ACM
12 years 9 months ago
DRAIN: distributed recovery architecture for inaccessible nodes in multi-core chips
As transistor dimensions continue to scale deep into the nanometer regime, silicon reliability is becoming a chief concern. At the same time, transistor counts are scaling up, ena...
Andrew DeOrio, Konstantinos Aisopos, Valeria Berta...
ICCAD
2009
IEEE
87views Hardware» more  ICCAD 2009»
13 years 7 months ago
The synthesis of combinational logic to generate probabilities
As CMOS devices are scaled down into the nanometer regime, concerns about reliability are mounting. Instead of viewing nanoscale characteristics as an impediment, technologies suc...
Weikang Qian, Marc D. Riedel, Kia Bazargan, David ...