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VLSID
2003
IEEE
145views VLSI» more  VLSID 2003»
15 years 10 months ago
Immediate Neighbor Difference IDDQ Test (INDIT) for Outlier Identification
Increasing values and spread in leakage current makes it impossible to distinguish between faulty and fault-free chips using single threshold method. Neighboring chips on a wafer ...
Sagar S. Sabade, D. M. H. Walker