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104
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DATE
2006
IEEE
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DATE 2006
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Pseudorandom functional BIST for linear and nonlinear MEMS
15 years 9 months ago
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Pseudorandom test techniques are widely used for measuring the impulse response (IR) for linear devices and Volterra kernels for nonlinear devices, especially in the acoustics dom...
Achraf Dhayni, Salvador Mir, Libor Rufer, Ahc&egra...
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