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116
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DDECS
2007
IEEE
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DDECS 2007
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Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair
15 years 9 months ago
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www.date.uni-paderborn.de
—An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. A commonly used repair strategy is to equip memories with sp...
Philipp Öhler, Sybille Hellebrand, Hans-Joach...
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