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82
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PRDC
2006
IEEE
15 years 3 months ago
SEVA: A Soft-Error- and Variation-Aware Cache Architecture
As SRAM devices are scaled down, the number of variation-induced defective memory cells increases rapidly. Combination of ECC, particularly SECDED, with a redundancy technique can...
Luong Dinh Hung, Masahiro Goshima, Shuichi Sakai