Sciweavers

60
Voted
DFT
2004
IEEE
92views VLSI» more  DFT 2004»
15 years 21 days ago
Reliability and Yield: A Joint Defect-Oriented Approach
We present a model for computing the probability of a parametric failure due to a spot defect. The analysis is based on electromigration in conductors under unidirectional current...
Roman Barsky, Israel A. Wagner