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138
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CODES
2006
IEEE
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Software Engineering
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CODES 2006
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Yield prediction for architecture exploration in nanometer technology nodes: : a model and case study for memory organizations
15 years 9 months ago
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www.cecs.uci.edu
Process variability has a detrimental impact on the performance of memories and other system components, which can lead to parametric yield loss at the system level due to timing ...
Antonis Papanikolaou, T. Grabner, Miguel Miranda, ...
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