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DAC
2003
ACM
15 years 11 months ago
Death, taxes and failing chips
In the way they cope with variability, present-day methodologies are onerous, pessimistic and risky, all at the same time! Dealing with variability is an increasingly important as...
Chandu Visweswariah
65
Voted
DAC
2003
ACM
15 years 11 months ago
Statistical timing for parametric yield prediction of digital integrated circuits
Jochen A. G. Jess, K. Kalafala, Srinath R. Naidu, ...