Sciweavers

116
Voted
DAC
2003
ACM
16 years 1 months ago
Death, taxes and failing chips
In the way they cope with variability, present-day methodologies are onerous, pessimistic and risky, all at the same time! Dealing with variability is an increasingly important as...
Chandu Visweswariah
73
Voted
DAC
2003
ACM
16 years 1 months ago
Statistical timing for parametric yield prediction of digital integrated circuits
Jochen A. G. Jess, K. Kalafala, Srinath R. Naidu, ...