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DATE
2002
IEEE
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DATE 2002
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Modeling Techniques and Tests for Partial Faults in Memory Devices
15 years 7 months ago
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: It has always been assumed that fault models in memories are sufficiently precise for specifying the faulty behavior. This means that, given a fault model, it should be possible...
Zaid Al-Ars, A. J. van de Goor
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