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DATE
2008
IEEE
66views Hardware» more  DATE 2008»
15 years 3 months ago
Optimal Margin Computation for At-Speed Test
— In the face of increased process variations, at-speed manufacturing test is necessary to detect subtle delay defects. This procedure necessarily tests chips at a slightly highe...
Jinjun Xiong, Vladimir Zolotov, Chandu Visweswaria...