Sciweavers

66
Voted
MVA
2007
112views Computer Vision» more  MVA 2007»
15 years 11 days ago
A Physics-Based Imaging Model of Scanning Electron Microscopes
This paper discusses a physics-based imaging model of scanning electron microscopes (SEM). The purpose is to accurately examine the imaging process of a SEM, which has to be neces...
Kousuke Kamada, Takayuki Okatani, Koichiro Deguchi