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99
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ICCAD
2007
IEEE
143
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ICCAD 2007
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TIP-OPC: a new topological invariant paradigm for pixel based optical proximity correction
15 years 11 months ago
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www.cerc.utexas.edu
—As the 193nm lithography is likely to be used for 45nm and even 32nm processes, much more stringent requirement will be posed on Optical Proximity Correction (OPC) technologies....
Peng Yu, David Z. Pan
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