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DDECS
2007
IEEE
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DDECS 2007
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Design and Analysis of a New Self-Testing Adder which Utilizes Polymorphic Gates
15 years 9 months ago
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www.fit.vutbr.cz
— This paper describes a new self-testing 1-bit full adder. This circuit consists of three polymorphic NAND/NOR gates, two XOR gates and two inverters. The adder is able to detec...
Lukás Sekanina
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