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97
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ISQED
2005
IEEE
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Hardware
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ISQED 2005
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Simulating and Improving Microelectronic Device Reliability by Scaling Voltage and Temperature
15 years 8 months ago
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www.enre.umd.edu
The purpose of this work is to explore how device operation parameters such as switching speed and power dissipation scale with voltage and temperature. We simulated a CMOS ring o...
Xiaojun Li, Joerg D. Walter, Joseph B. Bernstein
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