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119
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DAC
2006
ACM
105
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Computer Architecture
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DAC 2006
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Standard cell characterization considering lithography induced variations
16 years 4 months ago
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dropzone.tamu.edu
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...
Ke Cao, Sorin Dobre, Jiang Hu
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