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112
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VLSID
2007
IEEE
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VLSI
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VLSID 2007
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Controllability-driven Power Virus Generation for Digital Circuits
16 years 3 months ago
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www.cerc.utexas.edu
The problem of peak power estimation in CMOS circuits is essential for analyzing the reliability and performance of circuits at extreme conditions. The Power Virus problem involves...
K. Najeeb, Karthik Gururaj, V. Kamakoti, Vivekanan...
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