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    ICCAD
    2004
    IEEE
    97views Hardware» more  ICCAD 2004»
    Statistical design and optimization of SRAM cell for yield enhancement
    15 years 10 months ago
    Statistical design and optimization of SRAM cell for yield enhancement
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    In this paper, we have analyzed ond modeled the fiilure probabilities ofSRAM cells due to process parameter variations. A method to predict the yield of a memoiy chip based on the...
    Saibal Mukhopadhyay, Hamid Mahmoodi-Meimand, Kaush...
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